HX8N0 series automatic probe station
The HX8N0 series of fully automatic probe table equipment is specialized for the performance testing of all kinds of devices at the wafer level of 8 inches,Can be tested against different wafers,Can be equipped with appropriate instruments,The characteristics of I-V, C-V and optical signals are analyzed,Equipment features,Can match a variety of test application environments,Can upgrade high-power wafer testing, RF testing, fully automatic testing and can load temperature control system,To meet customer requirements for various wafer device performance testing in high and low temperature environments。