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HX50N series semi-automatic probe station
The HX50N series semi-automatic probe station is suitable for 4-inch and 5-inch wafers,Inclusion diode,triode,Measurement of MOSFET tube and vertical structure chip,Especially suitable for warped wafers and high voltage chip testing,Optional multi-pin test function,It can realize the requirements of multiple measurement at the same time,Increase the testing capacity of the machine。
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HX80N series semi-automatic probe station
The HX80N series semi-automatic probe table is a custom-made integrated probe table for sensor wafer testing with excellent test accuracy. It can be combined with customized instrumentation systems to perform tests such as photoelectric sensors, pressure sensors and gas sensors。
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HX12N series semi-automatic probe station
The HX12N series semi-automatic probe station is equipped with a high-precision linear motor slide module, and the stroke meets the test of 8-inch and 12-inch chips。High positioning accuracy,Fast reaction speed and long service life,The sliding table is also equipped with a high-precision grating feedback system,The reliability of the running accuracy is guaranteed,And this module is the company's self-developed products,The finished product quality and production cycle of the module are guaranteed,It provides fast and accurate hardware guarantee for the test of probe station。
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